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6 October 2025 / 15:00 - 17:00 CEST
EPIC Online Technology Meeting on Photonics Metrology Systems
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Photonics is revolutionizing industrial metrology by providing highly precise, non-contact measurement solutions for various manufacturing and quality control applications. By integrating photonics technologies, manufacturers can significantly improve quality control, reduce waste, and enhance overall production efficiency, all while maintaining high levels of accuracy and reliability in their processes. Techniques such as laser interferometry or optical profilometry are widely used to measure surface profiles, dimensions, and geometric properties with nanometer-level accuracy. These photonic methods enable real-time, high-speed measurements of complex parts and components, ensuring that they meet stringent tolerances without damaging delicate surfaces. 3D laser scanning and optical coherence tomography (OCT) are also employed to create detailed, accurate models of industrial components, allowing for advanced inspection and analysis.

In this online meeting, we will discuss about the latest requirements and challenges of the industry related with the measurement and characterization of final products and the new developments proposed by the manufacturers. We will also focus in the trend of combining metrology solutions with robotic arms and high precision movement systems to integrate them in the manufacturing process and perform inline measurements.

Agenda

15:00 – 15:15  Opening by Antonio Castelo, Photonics Technology Expert at EPIC

15:15 – 15:30 Tecnottica Consonni The Optical Metrology Market –  Alberto Fasoli, COO (Italy)
15:30 – 15:45 SensofarOptical Metrology for the Industry – David Páez, Senior Product Specialist (Spain)
15:45 – 16:00 Wyse LightFreeform Shape Measurement
with Coaxial Deflectometry -Yves Surrel, Founder, Chief Scientist & President (France)
16:00 – 16:15 Imagine OpticWavefront Sensing Metrology
Some Trends & Challenges of the Industry – Rafael Porcar, Head of Optical Metrology Division (France)
16:15 – 16:30 Silicon Austria LabsSecond Harmonic Generation at Interfaces for Semiconductor Metrology –  Christoph Leithold, Scientist, Photonic Systems (PHOS) (Austria)
16:30 – 16:45 EssentOpticsSpectrophotometers for Optical Coatings
Stop Guessing. Start Measuring – Taras Lisouski, Business Development (Lithuania)

16:45 – 17:00  Closing by Antonio Castelo, Photonics Technology Expert at EPIC

Speakers

Alberto Fasoli (Chief Operating Officer) joined Tecnottica - his family-owned company - in 2013 after completing his studies as an industrial technical expert in mechanics, he starts working directly in the production lines, following all the different steps that compose Tecnottica’s production cycle, with a specialization in fine-optics polishing and advanced metrology. He’s become firstly the production manager and, after a 10+ year experience, he’s started to work as Tecnottica’s Chief Operating Officer, following and managing all the daily activities that concour to the realization of all of the company products.

David Páez (Senior Product Specialist) studied his bachelor’s degree at the Polytechnic University of Catalonia (UPC), where he started to work as a Research Assistant in the Department of Physics. Once he finished his master’s degree at the University of Barcelona (UB) he entered into the world of optical metrology joining Sensofar.

Senior Product Specialist at Sensofar

Yves Surrel (Founder, Chief Scientist & President) founded Wyse-Light in 2021, where he leads the development of optical measurement instruments for reflective objects. An expert in optical metrology, he has built a distinguished career spanning both academia and industry. He previously served as a teacher-researcher at the École des Mines de Saint-Étienne, professor of instrumentation at the Conservatoire National des Arts et Métiers in Paris and at the National Institute of Metrology (now LNE), and Director of Research and Development at Visuol Technologies in Metz. Yves has contributed extensively to solving challenges in optical metrology, with particular expertise in deflectometry. Yves holds a PhD in Physics and is a graduate of the École Normale Supérieure.

Founder, Chief Scientist & President at Wyse Light

Rafael Porcar (Head of Optical Metrology Division) graduated in optics and electronics in 1996 and first worked as an optical engineer and project manager for the development of custom metrology systems in Paris. After a few years as a research engineer at ICFO in Barcelona, he founded two deep tech photonics start-ups and, as CEO and CTO, developed his experience in collaborative research and innovation, intellectual property management and public and private funding. Since 2021, he is putting his expertise at the service of Imagine Optic as head of the optical metrology division.

Head of Optical Metrology Division at Imagine Optic

Christoph Leithold (Scientist, Photonic Systems (PHOS)) is a physicist at Silicon Austria Labs, where he has been conducting applied research in optical systems and spectroscopy since 2021. Christoph holds a Diploma in Physics from Dresden University of Technology.

Scientist, Photonic Systems (PHOS) at Silicon Austria Labs

Taras Lisouski (Head of Business Development) is a co-founder of EssentOptics, bringing over two decades of experience in the photonics industry. His career began in 2000 at a manufacturer of optical coating equipment, where he specialized in thin-film technology. Recognizing the need for advanced metrology tools, he and a team of engineers established EssentOptics to focus on broadband spectral measurements for optical coatings. A graduate of Belarus National Technical University with an MBA, Taras believes that expertise-driven innovation is key to solving the most demanding challenges in optical thin-film metrology.

Business Development at EssentOptics
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Antonio Castelo, PhD
Antonio Castelo, PhD
Technology Expert for Bio-Medical and Lasers
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